X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6
Temperature 277.0
Details 100MM BISTRIS AT PH 6.0, 12.5% 2,5-HEXANEDIOL, AND 12% PEG3350, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 50.77 α = 90
b = 104.42 β = 90
c = 110.13 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 -- 2008-03-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 1.1 ALS 8.3.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.45 110.13 99.8 -- 0.072 -- 4.5 -- 22230 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.45 2.58 99.9 0.524 0.524 1.4 4.5 3193

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.45 21.3 -- -- 22101 21223 1146 99.56 0.2143 0.2143 0.2125 0.2575 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4507 2.562 -- 142 2570 0.3323 0.3173 -- 94.0
X Ray Diffraction 2.562 2.6968 -- 129 2602 0.3023 0.3415 -- 95.0
X Ray Diffraction 2.6968 2.8654 -- 137 2581 0.2837 0.3466 -- 95.0
X Ray Diffraction 2.8654 3.0861 -- 142 2581 0.269 0.3498 -- 95.0
X Ray Diffraction 3.0861 3.3955 -- 142 2615 0.2319 0.2977 -- 95.0
X Ray Diffraction 3.3955 3.8842 -- 130 2639 0.2012 0.2405 -- 95.0
X Ray Diffraction 3.8842 4.8839 -- 129 2646 0.1679 0.2228 -- 95.0
X Ray Diffraction 4.8839 21.2756 -- 156 2744 0.1766 0.2014 -- 94.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 65.2303
Anisotropic B[1][1] 24.0938
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -6.2523
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -17.8415
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.649
f_plane_restr 0.004
f_chiral_restr 0.048
f_dihedral_angle_d 16.634
f_bond_d 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4002
Nucleic Acid Atoms 0
Heterogen Atoms 33
Solvent Atoms 65

Software

Software
Software Name Purpose
MOSFLM data reduction version: 3.3.15
SCALA data scaling version: 3.3.15
PHENIX refinement version: 1.5_2
PDB_EXTRACT data extraction version: 3.10
MOLREP phasing