X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Temperature 293.0
Details 0.1 M citric acid, pH 3.5, 2.0 M ammonium sulfate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 88.34 α = 90
b = 88.34 β = 90
c = 215.24 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 270 -- 2015-06-05
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 7A (6B, 6C1) 1.0 PAL/PLS 7A (6B, 6C1)

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 99.8 -- -- -- 17.2 -- 39971 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
-- -- -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 31.178 -- 1.39 -- 39971 2006 99.87 -- 0.1971 0.1956 0.2261 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9004 1.9479 -- 144 2615 0.2082 0.2522 -- 99.0
X Ray Diffraction 1.9479 2.0005 -- 141 2658 0.1946 0.2481 -- 100.0
X Ray Diffraction 2.0005 2.0594 -- 154 2650 0.1916 0.2111 -- 100.0
X Ray Diffraction 2.0594 2.1259 -- 144 2662 0.1786 0.2086 -- 100.0
X Ray Diffraction 2.1259 2.2018 -- 126 2685 0.1816 0.2487 -- 100.0
X Ray Diffraction 2.2018 2.2899 -- 114 2686 0.1858 0.2209 -- 100.0
X Ray Diffraction 2.2899 2.3941 -- 141 2691 0.1958 0.2744 -- 100.0
X Ray Diffraction 2.3941 2.5203 -- 143 2681 0.1961 0.2171 -- 100.0
X Ray Diffraction 2.5203 2.6781 -- 165 2683 0.1977 0.2308 -- 100.0
X Ray Diffraction 2.6781 2.8848 -- 139 2695 0.2018 0.2156 -- 100.0
X Ray Diffraction 2.8848 3.1748 -- 147 2735 0.1974 0.2239 -- 100.0
X Ray Diffraction 3.1748 3.6336 -- 136 2755 0.188 0.2 -- 100.0
X Ray Diffraction 3.6336 4.5757 -- 152 2795 0.1783 0.1982 -- 100.0
X Ray Diffraction 4.5757 31.1819 -- 160 2974 0.2222 0.2632 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.007
f_dihedral_angle_d 14.111
f_plane_restr 0.005
f_angle_d 1.152
f_chiral_restr 0.044
Coordinate Error
Parameter Value
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3187
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 311

Software

Software
Software Name Purpose
PHENIX refinement version: 1.9_1692
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing