X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.1
Temperature 277.15
Details 27 - 32 % PEG 200, 0.1 M Tris pH 8.1, 200 mM CaCl2

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 184.35 α = 90
b = 184.35 β = 90
c = 88.76 γ = 90
Symmetry
Space Group I 4

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 94
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX300HE -- 2016-01-16
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.979 CLSI 08ID-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.79 50 100.0 -- -- -- 5.1 -- 37109 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.79 2.84 99.9 -- -- 1.72 5.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.79 42.01 -- 2.79 -- 32445 1637 87.4 -- 0.22 0.219 0.241 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7926 2.8748 -- 58 1074 0.3049 0.3445 -- 37.0
X Ray Diffraction 2.8748 2.9675 -- 88 1452 0.3057 0.3362 -- 50.0
X Ray Diffraction 2.9675 3.0736 -- 100 2087 0.281 0.2877 -- 71.0
X Ray Diffraction 3.0736 3.1966 -- 154 2652 0.2891 0.2873 -- 92.0
X Ray Diffraction 3.1966 3.342 -- 152 2903 0.2623 0.2906 -- 99.0
X Ray Diffraction 3.342 3.5181 -- 154 2922 0.2487 0.2516 -- 100.0
X Ray Diffraction 3.5181 3.7384 -- 150 2929 0.232 0.2458 -- 100.0
X Ray Diffraction 3.7384 4.0269 -- 158 2926 0.2038 0.2258 -- 100.0
X Ray Diffraction 4.0269 4.4317 -- 155 2958 0.186 0.2091 -- 100.0
X Ray Diffraction 4.4317 5.072 -- 154 2926 0.1802 0.2178 -- 100.0
X Ray Diffraction 5.072 6.3866 -- 155 2972 0.2122 0.2296 -- 100.0
X Ray Diffraction 6.3866 42.0177 -- 159 3007 0.1924 0.2201 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.003
f_angle_d 0.702
f_dihedral_angle_d 13.128
f_plane_restr 0.002
f_chiral_restr 0.035
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7327
Nucleic Acid Atoms 234
Heterogen Atoms 0
Solvent Atoms 23

Software

Software
Software Name Purpose
PHENIX refinement version: (1.10_2142: ???)
HKL-2000 data scaling
PHASER phasing
Coot model building