X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion
Temperature 293.0
Details 0.2 M Potassium thiocyanate 20%(w/v) PEG 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 94.08 α = 90
b = 94.08 β = 90
c = 192.42 γ = 120
Symmetry
Space Group H 3

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210r -- 2017-07-28
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL14-1 1.19 SSRL BL14-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.95 37.93 96.92 -- -- -- 3.4 -- 12983 -- -- 69.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.95 3.06 92.35 -- -- 1.7 2.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.95 37.934 -- 487.88 -- 12983 1326 96.97 -- 0.5499 0.2644 0.3027 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.9508 3.0688 -- 134 1230 0.7336 0.7449 -- 83.0
X Ray Diffraction 3.0688 3.2082 -- 141 1265 0.7084 0.7036 -- 84.0
X Ray Diffraction 3.2082 3.3771 -- 136 1272 0.6636 0.6571 -- 86.0
X Ray Diffraction 3.3771 3.5882 -- 140 1279 0.6314 0.636 -- 87.0
X Ray Diffraction 3.5882 3.8645 -- 147 1309 0.6164 0.602 -- 88.0
X Ray Diffraction 3.8645 4.2521 -- 149 1329 0.5778 0.5723 -- 89.0
X Ray Diffraction 4.2521 4.8643 -- 151 1318 0.545 0.5884 -- 89.0
X Ray Diffraction 4.8643 6.117 -- 149 1343 0.4533 0.4734 -- 90.0
X Ray Diffraction 6.117 27.1611 -- 144 1331 0.4977 0.4785 -- 90.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.738
f_chiral_restr 0.043
f_plane_restr 0.003
f_dihedral_angle_d 16.049
f_bond_d 0.003
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3989
Nucleic Acid Atoms 0
Heterogen Atoms 56
Solvent Atoms 0

Software

Software
Software Name Purpose
PHENIX refinement version: (1.11.1_2575: ???)
HKL-2000 data reduction
HKL-2000 data scaling
PHASER phasing