X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 289.0
Details 1.2-1.35 M (NH4)2SO4, 0.1 M Tris-HCl (pH 8.6-9.2) 0-20% glycerol 25 mM (Na/K) dibasic/monobasic phosphate

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 116.61 α = 90
b = 61.9 β = 92.17
c = 46.65 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 -- 2016-04-24
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.00000 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.99 30.95 99.7 0.161 -- -- 4.9 -- 22852 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.987 2.06 97.7 0.94 -- -- 4.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.987 30.95 -- 1.34 -- 22831 1159 99.2 -- 0.1902 0.1887 0.2174 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9868 2.0772 -- 123 2573 0.2786 0.2719 -- 94.0
X Ray Diffraction 2.0772 2.1867 -- 150 2675 0.2482 0.2394 -- 100.0
X Ray Diffraction 2.1867 2.3237 -- 137 2739 0.2242 0.2438 -- 100.0
X Ray Diffraction 2.3237 2.503 -- 148 2713 0.2159 0.2764 -- 100.0
X Ray Diffraction 2.503 2.7547 -- 145 2735 0.2025 0.2829 -- 100.0
X Ray Diffraction 2.7547 3.153 -- 143 2722 0.1797 0.2216 -- 100.0
X Ray Diffraction 3.153 3.9712 -- 147 2727 0.1541 0.1665 -- 100.0
X Ray Diffraction 3.9712 30.9532 -- 166 2788 0.1633 0.1972 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.003
f_angle_d 0.628
f_chiral_restr 0.043
f_dihedral_angle_d 4.165
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2377
Nucleic Acid Atoms 0
Heterogen Atoms 58
Solvent Atoms 168

Software

Software
Software Name Purpose
PHENIX refinement version: (1.13_2998: ???)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing