ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details Blot for 4 seconds and wait for 30 seconds before plunging
Sample Aggregation State PARTICLE
Sample Reconstruction Method SINGLE PARTICLE
Name of Sample Tra1 / ScTra1
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) --
Microscope Model FEI TITAN KRIOS
Detector Type GATAN K2 SUMMIT (4k x 4k)
Minimum Defocus (nm) 1200.0
Maximum Defocus (nm) 3000.0
Minimum Tilt Angle (degrees) --
Maximum Tilt Angle (degrees) --
Nominal CS 0.1
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 5.6
Illumination Mode FLOOD BEAM
Nominal Magnification 81000
Calibrated Magnification 81000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s) RELION
Reconstruction Method(s) GPU accelerated
EM Image Reconstruction Statistics
Number of Particles 176464
Other Details GPU accelerated
Effective Resolution 4.6
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
REAL AB INITIO MODEL -- -- -- --