X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.1
Temperature 293.0
Details 0.1M NaAc, 2M (NH4)2SO4, pH 5.1

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 143.42 α = 90
b = 143.42 β = 90
c = 143.42 γ = 90
Symmetry
Space Group P 41 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS EIGER X 16M -- 2018-09-28
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U1 0.9792 SSRF BL17U1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 50 99.9 0.052 -- -- 11.7 -- 32118 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.05 2.09 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.052 47.807 -- 1.36 -- 32118 2995 80.39 -- 0.1541 0.152 0.1864 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0522 2.0859 -- 88 1319 0.2481 0.3037 -- 50.0
X Ray Diffraction 2.0859 2.1219 -- 93 1392 0.2152 0.2826 -- 52.0
X Ray Diffraction 2.1219 2.1604 -- 92 1388 0.1881 0.1958 -- 53.0
X Ray Diffraction 2.1604 2.202 -- 94 1402 0.1864 0.2039 -- 53.0
X Ray Diffraction 2.202 2.2469 -- 93 1399 0.181 0.1861 -- 53.0
X Ray Diffraction 2.2469 2.2958 -- 94 1407 0.1825 0.2629 -- 53.0
X Ray Diffraction 2.2958 2.3492 -- 95 1412 0.1808 0.2111 -- 53.0
X Ray Diffraction 2.3492 2.4079 -- 97 1504 0.1812 0.2012 -- 56.0
X Ray Diffraction 2.4079 2.473 -- 129 1981 0.176 0.2261 -- 73.0
X Ray Diffraction 2.473 2.5458 -- 166 2499 0.1724 0.2639 -- 95.0
X Ray Diffraction 2.5458 2.628 -- 176 2631 0.1742 0.2059 -- 99.0
X Ray Diffraction 2.628 2.7219 -- 183 2647 0.1737 0.1801 -- 100.0
X Ray Diffraction 2.7219 2.8309 -- 177 2650 0.1672 0.2148 -- 100.0
X Ray Diffraction 2.8309 2.9597 -- 177 2663 0.1773 0.2107 -- 100.0
X Ray Diffraction 2.9597 3.1157 -- 178 2677 0.1551 0.2432 -- 100.0
X Ray Diffraction 3.1157 3.3109 -- 176 2653 0.1466 0.1804 -- 100.0
X Ray Diffraction 3.3109 3.5664 -- 169 2661 0.1399 0.1646 -- 100.0
X Ray Diffraction 3.5664 3.9252 -- 178 2654 0.1235 0.2054 -- 100.0
X Ray Diffraction 3.9252 4.4928 -- 176 2665 0.1092 0.1287 -- 100.0
X Ray Diffraction 4.4928 5.659 -- 172 2671 0.1231 0.1247 -- 100.0
X Ray Diffraction 5.659 47.8203 -- 192 2654 0.1763 0.182 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.683
f_plane_restr 0.008
f_bond_d 0.014
f_chiral_restr 0.082
f_dihedral_angle_d 8.24
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1525
Nucleic Acid Atoms 0
Heterogen Atoms 108
Solvent Atoms 125

Software

Software
Software Name Purpose
PHENIX refinement version: (1.11.1_2575: ???)
HKL-2000 data reduction
SCALA data scaling
PHASER phasing