X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6.5
Temperature 277.0
Details MPD

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 401.3 α = 90
b = 401.3 β = 90
c = 176.4 γ = 90
Symmetry
Space Group P 41 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL CS-PAD CXI-1 -- 2014-11-17
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
FREE ELECTRON LASER SLAC LCLS BEAMLINE CXI 1.29 SLAC LCLS CXI

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 52.84 100.0 0.29 -- -- 15.5 -- 195895 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.4 -- 100.0 0.87 -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.4 52.84 -- 1.33 -- 195895 1413 99.98 -- 0.1931 0.1928 0.2336 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.4 3.5215 -- 139 19216 0.3113 0.357 -- 100.0
X Ray Diffraction 3.5215 3.6625 -- 140 19229 0.275 0.2907 -- 100.0
X Ray Diffraction 3.6625 3.8291 -- 141 19273 0.249 0.3182 -- 100.0
X Ray Diffraction 3.8291 4.0309 -- 139 19286 0.2167 0.2808 -- 100.0
X Ray Diffraction 4.0309 4.2834 -- 141 19347 0.1999 0.2271 -- 100.0
X Ray Diffraction 4.2834 4.6139 -- 141 19392 0.1824 0.2243 -- 100.0
X Ray Diffraction 4.6139 5.0779 -- 141 19425 0.1668 0.2163 -- 100.0
X Ray Diffraction 5.0779 5.8119 -- 141 19466 0.1627 0.2265 -- 100.0
X Ray Diffraction 5.8119 7.3192 -- 144 19666 0.1667 0.1854 -- 100.0
X Ray Diffraction 7.3192 52.8358 -- 146 20182 0.1755 0.212 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.006
f_plane_restr 0.004
f_dihedral_angle_d 20.277
f_angle_d 0.859
f_chiral_restr 0.04
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 19143
Nucleic Acid Atoms 32504
Heterogen Atoms 541
Solvent Atoms 308

Software

Software
Software Name Purpose
PHENIX refinement version: dev_1938
CrystFEL data reduction
CrystFEL data scaling
PHASER phasing