X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 293.0
Details 0.1 M CITRIC ACID, 0.1 M SODIUM HYDROGEN PHOSPHATE, 0.4 M POTASSIUM HYDROGEN PHOSPHATE, 1.6 M SODIUM DIHYDROGEN PHOSPHATE, PH 5.5, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 64.22 α = 90
b = 82.53 β = 90
c = 212.53 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2011-12-15
Diffraction Radiation
Monochromator Protocol
VARIMAX SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 33 95.8 0.082 -- -- 4.35 -- 34163 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.67 93.7 0.338 -- 4.65 4.36 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 33.0 -- 1.99 -- 34159 1709 95.9 -- 0.179 0.177 0.222 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6764 -- 138 2614 0.2016 0.2607 -- 94.0
X Ray Diffraction 2.6764 2.7627 -- 137 2611 0.2012 0.2716 -- 95.0
X Ray Diffraction 2.7627 2.8614 -- 138 2615 0.2045 0.2586 -- 95.0
X Ray Diffraction 2.8614 2.9759 -- 140 2651 0.2012 0.2563 -- 95.0
X Ray Diffraction 2.9759 3.1112 -- 140 2662 0.1952 0.2532 -- 96.0
X Ray Diffraction 3.1112 3.2751 -- 141 2685 0.1834 0.2457 -- 96.0
X Ray Diffraction 3.2751 3.4801 -- 141 2678 0.1767 0.248 -- 96.0
X Ray Diffraction 3.4801 3.7485 -- 143 2717 0.1603 0.2335 -- 96.0
X Ray Diffraction 3.7485 4.125 -- 143 2718 0.1518 0.2001 -- 97.0
X Ray Diffraction 4.125 4.7205 -- 145 2747 0.133 0.1525 -- 97.0
X Ray Diffraction 4.7205 5.9416 -- 148 2810 0.1636 0.1869 -- 97.0
X Ray Diffraction 5.9416 33.0023 -- 155 2942 0.2239 0.2212 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.004
f_chiral_restr 0.053
f_dihedral_angle_d 11.365
f_plane_restr 0.004
f_angle_d 0.799
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6706
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 341

Software

Software
Software Name Purpose
XDS data reduction
XSCALE data scaling
MOLREP phasing
PHENIX refinement version: 1.8_1069