X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 294.0
Details 0.2M sodium dihydrogen phosphate 20% PEG 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.94 α = 90
b = 56.3 β = 90
c = 82.39 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2016-07-27
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.97920 APS 24-ID-E

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.19 50 90.3 -- 0.097 -- 5.3 -- 20855 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.19 2.3 85.7 0.689 -- 1.8 3.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SIRAS 2.191 46.487 -- 1.36 -- 20855 2083 90.38 -- 0.1933 0.1877 0.2456 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.1908 2.2418 -- 107 951 0.258 0.3411 -- 69.0
X Ray Diffraction 2.2418 2.2978 -- 102 960 0.243 0.2957 -- 70.0
X Ray Diffraction 2.2978 2.36 -- 118 1102 0.2391 0.3049 -- 79.0
X Ray Diffraction 2.36 2.4294 -- 133 1262 0.2284 0.2953 -- 90.0
X Ray Diffraction 2.4294 2.5078 -- 143 1272 0.2366 0.302 -- 92.0
X Ray Diffraction 2.5078 2.5974 -- 144 1303 0.2151 0.2882 -- 94.0
X Ray Diffraction 2.5974 2.7014 -- 139 1298 0.2066 0.2607 -- 95.0
X Ray Diffraction 2.7014 2.8244 -- 148 1288 0.2317 0.2677 -- 94.0
X Ray Diffraction 2.8244 2.9732 -- 154 1333 0.2341 0.2974 -- 96.0
X Ray Diffraction 2.9732 3.1595 -- 151 1362 0.2106 0.3126 -- 97.0
X Ray Diffraction 3.1595 3.4034 -- 148 1342 0.1936 0.2252 -- 98.0
X Ray Diffraction 3.4034 3.7457 -- 147 1316 0.1742 0.2231 -- 95.0
X Ray Diffraction 3.7457 4.2874 -- 153 1338 0.1549 0.2246 -- 97.0
X Ray Diffraction 4.2874 5.4004 -- 149 1313 0.1453 0.1906 -- 95.0
X Ray Diffraction 5.4004 46.497 -- 147 1332 0.1651 0.2206 -- 96.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.051
f_bond_d 0.007
f_dihedral_angle_d 5.395
f_angle_d 0.979
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1742
Nucleic Acid Atoms 0
Heterogen Atoms 29
Solvent Atoms 108

Software

Software
Software Name Purpose
PHENIX refinement version: (1.12_2829)
HKL-2000 data reduction
HKL-2000 data scaling
SHELXCD phasing