X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 291.0
Details 16-18% PEG 3350

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 50.81 α = 90
b = 79.64 β = 107.78
c = 55.48 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944 -- 2015-05-07
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 93.7 0.057 -- -- 3.7 -- 31150 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.93 64.8 0.415 -- -- 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.9 23.72 -- 1.34 -- 31138 2000 93.45 -- 0.1735 0.1713 0.2064 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8978 1.9453 -- 95 1384 0.2318 0.2848 0.0 62.0
X Ray Diffraction 1.9453 1.9978 -- 130 1890 0.2021 0.2507 0.0 86.0
X Ray Diffraction 1.9978 2.0566 -- 145 2119 0.2043 0.2631 0.0 94.0
X Ray Diffraction 2.0566 2.1229 -- 144 2094 0.1866 0.2258 0.0 95.0
X Ray Diffraction 2.1229 2.1988 -- 144 2099 0.1786 0.223 0.0 95.0
X Ray Diffraction 2.1988 2.2867 -- 143 2097 0.1802 0.244 0.0 95.0
X Ray Diffraction 2.2867 2.3907 -- 147 2144 0.1802 0.2269 0.0 96.0
X Ray Diffraction 2.3907 2.5166 -- 148 2148 0.1906 0.2181 0.0 96.0
X Ray Diffraction 2.5166 2.6741 -- 148 2157 0.1881 0.2503 0.0 97.0
X Ray Diffraction 2.6741 2.8802 -- 148 2145 0.1962 0.241 0.0 97.0
X Ray Diffraction 2.8802 3.1695 -- 151 2206 0.2028 0.268 0.0 97.0
X Ray Diffraction 3.1695 3.6267 -- 150 2188 0.1501 0.1743 0.0 98.0
X Ray Diffraction 3.6267 4.5639 -- 152 2209 0.1398 0.1644 0.0 99.0
X Ray Diffraction 4.5639 23.7217 -- 155 2258 0.1506 0.1538 0.0 99.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.1002
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_dihedral_angle_d 19.293
f_angle_d 1.022
f_bond_d 0.007
f_chiral_restr 0.068
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2612
Nucleic Acid Atoms 631
Heterogen Atoms 56
Solvent Atoms 511

Software

Software
Software Name Purpose
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX refinement version: 1.10.1_2155
PDB_EXTRACT data extraction version: 3.24
PHENIX phasing