X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, HANGING DROP | 4.8 | 293 | NaOAc buffer (pH = 4.8), 2% DMSO, 0.5% dioxane, and 10% NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K | 
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 2.7 | 54.55 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 58.696 | α = 90 | 
| b = 85.794 | β = 90 | 
| c = 46.145 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | P 21 21 2 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 90 | CCD | MARRESEARCH | 2004-11-10 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | APS BEAMLINE 22-ID | 1.0 | APS | 22-ID | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||||
| 1 | 1.22 | 10 | 82 | 64113 | 52547 | 4 | 2 | ||||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||||
| 1 | 1.22 | 1.27 | 53.3 | ||||||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R | 1.22 | 10 | 64113 | 52547 | 3211 | 91.8 | 0.1295 | 0.1263 | 0.14 | 0.1878 | 0.64 | RANDOM | |||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| Coordinate Error | ||
|---|---|---|
| Structure Solution Method | Refinement High Resolution | Refinement Low Resolution | 
| 38 | 1628.96 | 1727.28 | 
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| s_approx_iso_adps | 0.085 | 
| s_non_zero_chiral_vol | 0.084 | 
| s_zero_chiral_vol | 0.077 | 
| s_anti_bump_dis_restr | 0.064 | 
| s_similar_adp_cmpnt | 0.05 | 
| s_angle_d | 0.032 | 
| s_from_restr_planes | 0.0316 | 
| s_bond_d | 0.012 | 
| s_rigid_bond_adp_cmpnt | 0.004 | 
| s_similar_dist | |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 1510 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 205 | 
| Heterogen Atoms | 55 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| SHELX | model building | 
| SHELXL-97 | refinement | 
| MAR345 | data collection | 
| SCALEPACK | data scaling | 
| AMoRE | phasing | 














