8CW4

CryoEM structure of the N-pilus from Escherichia coli


ELECTRON MICROSCOPY
Sample
N-pilus of the type IV secretion system of Escherichia coli.
Specimen Preparation
Sample Aggregation StateHELICAL ARRAY
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details3 uL of the sample was repeatedly applied and manually blotted three times using the multiple blotting technique prior to the Vitrobot step to in ...3 uL of the sample was repeatedly applied and manually blotted three times using the multiple blotting technique prior to the Vitrobot step to increase the concentration of pili.
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles134660
Reported Resolution (Å)3
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement ProtocolAB INITIO MODEL
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 BIOQUANTUM (6k x 4k)
Electron Dose (electrons/Å**2)40
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)500
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification81000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC3.1
IMAGE ACQUISITIONSerialEM3.8
CTF CORRECTIONcryoSPARC3.1
MODEL REFINEMENTPHENIX1.19.2
MODEL REFINEMENTCoot0.9.5
INITIAL EULER ASSIGNMENTcryoSPARC3.1
FINAL EULER ASSIGNMENTcryoSPARC3.1
RECONSTRUCTIONcryoSPARC3.1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION