ELECTRON MICROSCOPY
Sample |
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crosslinked wild-type NL4-3 HIV-1 Intasome |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | HOMEMADE PLUNGER |
Cryogen Name | ETHANE |
Sample Vitrification Details | Cryo-EM grids were prepared by freezing using a manual plunger in cold room at 4C |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 22780 |
Reported Resolution (Å) | 8 |
Resolution Method | OTHER |
Other Details | 3D FSC server is used to compute map-model resolution at the threshold of 0.5. This reported resolution is not the map resolution because it is a comp ... |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C2 |
Map-Model Fitting and Refinement | |||||
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Id | 1 (6PUT, 1IHV, 1K6Y, 7Z1Z, 1EX4) | ||||
Refinement Space | REAL | ||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | Correlation coefficient | ||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | Domains of HIV-1 IN were rigid-body docked into cryo-EM density without any further refinement or adjustment of the coordinates. This rigid-body docke ... |
Data Acquisition | |||||||||
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Detector Type | GATAN K2 SUMMIT (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 60 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | TFS KRIOS |
Minimum Defocus (nm) | 800 |
Maximum Defocus (nm) | 2200 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 29000 |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
IMAGE ACQUISITION | Leginon | |
CTF CORRECTION | cryoSPARC | 4.2 |
MODEL FITTING | UCSF Chimera | |
INITIAL EULER ASSIGNMENT | cryoSPARC | 4.2 |
FINAL EULER ASSIGNMENT | cryoSPARC | 4.2 |
RECONSTRUCTION | cryoSPARC | 4.2 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION |