Crystal structure of Chi430 mutant E176A in the substrate complex
Serial Crystallography (SX)
Starting Model(s)
Initial Refinement Model(s) |
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Type | Source | Accession Code | Details |
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in silico model | AlphaFold | | |
Crystallization
Crystalization Experiments |
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ID | Method | pH | Temperature | Details |
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1 | VAPOR DIFFUSION, SITTING DROP | 4.5 | 290 | 0.1 M BIS-TRIS pH 5.5, 2.0 M Ammonium sulfate |
Crystal Properties |
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Matthews coefficient | Solvent content |
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2.48 | 50.42 |
Crystal Data
Unit Cell |
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Length ( Å ) | Angle ( ˚ ) |
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a = 121.676 | α = 90 |
b = 49.858 | β = 125.616 |
c = 92.602 | γ = 90 |
Symmetry |
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Space Group | C 1 2 1 |
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Diffraction
Diffraction Experiment |
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
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1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER X 16M | | 2025-01-03 | M | SINGLE WAVELENGTH |
Radiation Source |
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
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1 | SYNCHROTRON | SSRF BEAMLINE BL10U2 | 0.97918 | SSRF | BL10U2 |
Serial Crystallography
Sample delivery method |
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Diffraction ID | Description | Sample Delivery Method |
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1 | | fixed target |
Data Collection
Overall |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
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1 | 1.35 | 60.58 | 99.8 | 0.974 | 7.4 | 6 | | 98938 | | | 6.58 |
Highest Resolution Shell |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
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1 | 1.35 | 1.39 | | | 0.189 | 2.5 | 4.4 | |
Refinement
Statistics |
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Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B |
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X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 1.35 | 49.506 | 98914 | 4902 | 99.769 | 0.185 | 0.1842 | 0.1936 | 0.2033 | 0.2112 | 10.787 |
Temperature Factor Modeling |
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Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
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-0.057 | | 0.244 | -0.414 | | 0.06 |
RMS Deviations |
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Key | Refinement Restraint Deviation |
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r_dihedral_angle_6_deg | 15.13 |
r_dihedral_angle_3_deg | 12.533 |
r_dihedral_angle_1_deg | 6.28 |
r_lrange_it | 4.679 |
r_lrange_other | 4.664 |
r_dihedral_angle_2_deg | 4.058 |
r_scangle_it | 3.814 |
r_scangle_other | 3.814 |
r_scbond_other | 2.438 |
r_scbond_it | 2.436 |
RMS Deviations |
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Key | Refinement Restraint Deviation |
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r_dihedral_angle_6_deg | 15.13 |
r_dihedral_angle_3_deg | 12.533 |
r_dihedral_angle_1_deg | 6.28 |
r_lrange_it | 4.679 |
r_lrange_other | 4.664 |
r_dihedral_angle_2_deg | 4.058 |
r_scangle_it | 3.814 |
r_scangle_other | 3.814 |
r_scbond_other | 2.438 |
r_scbond_it | 2.436 |
r_mcangle_it | 1.97 |
r_mcangle_other | 1.969 |
r_angle_refined_deg | 1.959 |
r_mcbond_it | 1.269 |
r_mcbond_other | 1.269 |
r_angle_other_deg | 0.69 |
r_nbd_refined | 0.241 |
r_symmetry_nbd_other | 0.197 |
r_nbtor_refined | 0.194 |
r_symmetry_xyhbond_nbd_refined | 0.16 |
r_nbd_other | 0.149 |
r_xyhbond_nbd_refined | 0.123 |
r_chiral_restr | 0.104 |
r_symmetry_nbtor_other | 0.082 |
r_symmetry_nbd_refined | 0.056 |
r_bond_refined_d | 0.012 |
r_gen_planes_refined | 0.012 |
r_bond_other_d | 0.001 |
r_gen_planes_other | 0.001 |
Non-Hydrogen Atoms Used in Refinement |
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Non-Hydrogen Atoms | Number |
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Protein Atoms | 3238 |
Nucleic Acid Atoms | |
Solvent Atoms | 210 |
Heterogen Atoms | 57 |
Software
Software |
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Software Name | Purpose |
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REFMAC | refinement |
DIALS | data reduction |
Aimless | data scaling |
PHENIX | phasing |