BMP-9 Wild-Type Dimer With Radiation Damage in Neutral pH
Serial Crystallography (SX)
Starting Model(s)
Initial Refinement Model(s) |
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Type | Source | Accession Code | Details |
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experimental model | PDB | 1ZKZ | |
Crystallization
Crystalization Experiments |
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ID | Method | pH | Temperature | Details |
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1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 289.15 | 1M NaCl, 17% Glycerol, 0.1 M HEPEs pH 7.5 |
Crystal Properties |
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Matthews coefficient | Solvent content |
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3.83 | 67.89 |
Crystal Data
Unit Cell |
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Length ( Å ) | Angle ( ˚ ) |
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a = 71.203 | α = 90 |
b = 71.203 | β = 90 |
c = 146.515 | γ = 90 |
Symmetry |
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Space Group | I 41 2 2 |
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Diffraction
Diffraction Experiment |
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
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1 | 1 | x-ray | 100 | PIXEL | DECTRIS EIGER X 16M | | 2022-10-18 | M | SINGLE WAVELENGTH |
Radiation Source |
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
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1 | SYNCHROTRON | APS BEAMLINE 22-ID | 1 | APS | 22-ID |
Serial Crystallography
Sample delivery method |
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Diffraction ID | Description | Sample Delivery Method |
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1 | | fixed target |
Data Collection
Overall |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
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1 | 2.34 | 41.49 | 99.8 | 0.181 | 0.208 | 0.099 | 0.984 | 6 | 7.1 | | 8300 | | | 43.08 |
Highest Resolution Shell |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
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1 | 2.34 | 2.42 | 100 | | 1.21 | 1.305 | 0.478 | 0.638 | 1.8 | 7.3 | |
Refinement
Statistics |
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Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B |
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X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 2.34 | 41.49 | 1 | 8278 | 431 | 99.48 | 0.2012 | 0.1989 | 0.1992 | 0.2446 | 0.2454 | 60.29 |
Temperature Factor Modeling |
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Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
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| | | | | |
RMS Deviations |
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Key | Refinement Restraint Deviation |
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f_dihedral_angle_d | 10.5355 |
f_angle_d | 0.6279 |
f_chiral_restr | 0.0528 |
f_plane_restr | 0.0045 |
f_bond_d | 0.0038 |
Non-Hydrogen Atoms Used in Refinement |
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Non-Hydrogen Atoms | Number |
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Protein Atoms | 822 |
Nucleic Acid Atoms | |
Solvent Atoms | 51 |
Heterogen Atoms | 15 |
Software
Software |
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Software Name | Purpose |
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PHENIX | refinement |
iMOSFLM | data reduction |
Aimless | data scaling |
MOLREP | phasing |